HOME > Article > DetailIdentification of intermediate linear structure formed during Bi/Si(001) surface annealJ.H.G. Owen, D.R. Bowler, K. Miki. Surface Science 596 [1-3] 163-175. 2005.https://doi.org/10.1016/j.susc.2005.09.012 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 14:47:59 +0900 Updated at: 2026-11-02 05:13:48 +0900
