HOME > Article > DetailExciton localization in doped Si nanocrystals from single dot spectroscopy studiesI. Sychugov, J. Valenta, K. Mitsuishi, J. Linnros. Physical Review B 86 [7] 075311. 2012.https://doi.org/10.1103/physrevb.86.075311 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:51:48 +0900 Updated at: 2026-09-29 06:37:13 +0900
