HOME > 論文 > 書誌詳細Exciton localization in doped Si nanocrystals from single dot spectroscopy studiesI. Sychugov, J. Valenta, K. Mitsuishi, J. Linnros. Physical Review B 86 [7] 075311. 2012.https://doi.org/10.1103/physrevb.86.075311 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:51:48 +0900更新時刻: 2024-03-31 12:44:11 +0900