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Pronounced Surface Band Bending of Thin-Film Silicon Revealed by Modeling Core Levels Probed with Hard X-rays
(Pronounced Surface Band Bending of Thin-Film Silicon Revealed by Modeling Core Levels Probed with Hard X-rays / Pronounced Surface Band Bending of Thin-Film Silicon Revealed by Modeling Core Levels Probed with Hard X-rays)

David Wippler, Regan G. Wilks, Bart E. Pieters, Sacha J. van Albada, Dominic Gerlach, Jürgen Hüpkes, Marcus Bär, Uwe Rau.
ACS Applied Materials & Interfaces 8 [27] 17685-17693. 2016.

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      作成時刻: 2017-02-19 23:20:23 +0900 更新時刻: 2026-11-02 05:59:17 +0900

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