Pronounced Surface Band Bending of Thin-Film Silicon Revealed by Modeling Core Levels Probed with Hard X-rays
(Pronounced Surface Band Bending of Thin-Film Silicon Revealed by Modeling Core Levels Probed with Hard X-rays / Pronounced Surface Band Bending of Thin-Film Silicon Revealed by Modeling Core Levels Probed with Hard X-rays)
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-02-19 23:20:23 +0900 更新時刻: 2026-11-02 05:59:17 +0900
