HOME > Article > DetailComplex patterning by vertical interchange atom manipulation using atomic force microscopyY. Sugimoto, P. Pou, O. Custance, P. Jelinek, M. Abe, R. Perez, S. Morita. Science 322 [5900] 413-417. 2008.https://doi.org/10.1126/science.1160601 NIMS author(s)CUSTANCE, OscarFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 15:36:38 +0900Updated at: 2024-04-01 19:08:51 +0900