Intergrowth structure of α-phase in β-type TmAlB4 compound studied by high-angle annular detector dark-field scanning transmission electron microscopy | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Intergrowth structure of α-phase in β-type TmAlB4 compound studied by high-angle annular detector dark-field scanning transmission electron microscopy

Kunio Yubuta, Takao Mori, Andreas Leithe-Jasper, Horst Borrmann, Yuri Grin, Shigeru Okada, Toetsu Shishido.

Journal of Solid State Chemistry 219 274-279. 2014.

https://doi.org/10.1016/j.jssc.2014.07.038

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作成時刻: 2016-05-24 17:37:07 +0900更新時刻: 2024-04-02 04:10:04 +0900

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