走査SQUID顕微鏡による酸化物超伝導薄膜中の磁束・電流・欠陥の同時評価
(Characterization of Superconducting Thin Films by Scanning SQUID Microscopy)
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Created at: 2016-05-24 16:58:10 +0900Updated at: 2024-04-02 03:17:36 +0900