HOME > Article > DetailControl of device parameters by active layer thickness in organic field-effect transistorsMasataka Kano, Takeo Minari, Kazuhito Tsukagoshi, Hiroki Maeda. Applied Physics Letters 98 [7] 073307. 2011.https://doi.org/10.1063/1.3555463 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:20:03 +0900Updated at: 2024-11-07 07:14:29 +0900
