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RBS-PIXE Analysis on Thin Films of High-Tc Oxide Superconductors.
(酸化物超電導薄膜のRBS-PIXE分析.)

Ishii Akira, 中村恵吉, 中村恵吉, Nakamura Keikichi.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 75 [1-4] 388-391. 1993.
https://doi.org/10.1016/0168-583x(93)95682-u

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