HOME > Article > DetailDepth-resolved electronic structure measurements by hard X-ray photoemission combined with X-ray total reflection: Direct probing of surface band bending of polar GaNShigenori Ueda. Applied Physics Express 11 [10] 105701. 2018.https://doi.org/10.7567/apex.11.105701 NIMS author(s)UEDA, ShigenoriFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2018-09-05 15:22:47 +0900Updated at: 2024-05-02 08:46:01 +0900