Time-of-Flight Secondary Ion Mass Spectrometry Study of Zinc Oxide Micropatterning on Self-Assembled Monolayer Template | SAMURAI, NIMS Researchers Directory Service

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Time-of-Flight Secondary Ion Mass Spectrometry Study of Zinc Oxide Micropatterning on Self-Assembled Monolayer Template

N. Saito, H. Haneda, M. Komatsu, K. Koumoto.

Journal of The Electrochemical Society 153 [3] C170. 2006.

https://doi.org/10.1149/1.2161547

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 14:59:51 +0900Updated at: 2024-04-01 18:10:05 +0900

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