HOME > 論文 > 書誌詳細Electron Moire Method and its Application to Micro-Deformation Measurement.(電子線モアレ法とその微少変形測定への応用)KISHIMOTO, Satoshi, Xie Huinim, 新谷紀雄. Nanotechnology . 2000.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-09-05 11:00:45 +0900更新時刻: 2022-09-05 11:00:45 +0900
