Correlation between deep-level defects and turn-on recovery characteristics in AlGaN/GaN hetero-structures | SAMURAI, NIMS Researchers Directory Service

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Correlation between deep-level defects and turn-on recovery characteristics in AlGaN/GaN hetero-structures

Yoshitaka Nakano, Yoshihiro Irokawa, Yasunobu Sumida, Shuichi Yagi, Hiroji Kawai.

Journal of Applied Physics 112 [10] 106103. 2012.

https://doi.org/10.1063/1.4767367

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Created at: 2016-05-24 16:50:40 +0900 Updated at: 2026-10-30 08:03:24 +0900

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