SAMURAI - NIMS Researchers Database

HOME > 論文 > 書誌詳細

Correlation between deep-level defects and turn-on recovery characteristics in AlGaN/GaN hetero-structures

Yoshitaka Nakano, Yoshihiro Irokawa, Yasunobu Sumida, Shuichi Yagi, Hiroji Kawai.
Journal of Applied Physics 112 [10] 106103. 2012.

NIMS著者


    Materials Data Repository (MDR)上の本文・データセット


      作成時刻 :2016-05-24 16:50:40 +0900 更新時刻 :2022-09-05 13:32:18 +0900

      ▲ページトップへ移動