HOME > 論文 > 書誌詳細Transmission electron microscopy cross-sectional observation on mechanically and chemically lapped Si(111) surfaces堀内繁雄, 呉暁京, 塩飽秀明, 兵頭一行, 安藤正海. Japanese Journal Applied Physics (JJAP) 803. 1992.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-09-05 10:34:42 +0900 更新時刻: 2022-09-05 10:34:42 +0900
