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Effects of incidence angles of ions on the mass resolution of an energy compensated 3D atom probe

E. Bemont, A. Bostel, M. Bouet, G. Da Costa, S. Chambreland, B. Deconihout, HONO, Kazuhiro.

ULTRAMICROSCOPY 95 [5] 231-238. 2003.

作成時刻: 2016-05-24 12:01:17 +0900更新時刻: 2018-12-15 01:22:52 +0900