Effects of incidence angles of ions on the mass resolution of an energy compensated 3D atom probe

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E. Bemont, A. Bostel, M. Bouet, G. Da Costa, S. Chambreland, B. Deconihout, HONO, Kazuhiro.

ULTRAMICROSCOPY 95 [5] 231-238. 2003.

作成時刻: 2016-05-24 12:01:17 +0900 更新時刻: 2018-12-15 01:22:52 +0900