Relationship between X-ray Intensity and Bias on Al2O3 Surface during Low Energy Ga+ irradiation | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Relationship between X-ray Intensity and Bias on Al2O3 Surface during Low Energy Ga+ irradiation

Jiancun RAO, 長谷川明, Renchao CHE, 竹口雅樹, 古屋一夫.

MATERIALS TRANSACTIONS 861-863. 2006.

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作成時刻: 2022-10-21 22:15:09 +0900更新時刻: 2022-10-21 22:15:09 +0900

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