HOME > 論文 > 書誌詳細New Insights on Atomic-Resolution Frequency-Modulation Kelvin-Probe Force-Microscopy Imaging of SemiconductorsSascha Sadewasser, Pavel Jelinek, Chung-Kai Fang, Oscar Custance, Yusaku Yamada, Yoshiaki Sugimoto, Masayuki Abe, Seizo Morita. Physical Review Letters 103 [26] 266103. 2009.https://doi.org/10.1103/physrevlett.103.266103 NIMS著者クスタンセ オスカルMaterials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:58:25 +0900更新時刻: 2024-04-02 00:31:09 +0900
