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Reflection-type quantitative phase microscopy for thermal conductivity and thermo-optic coefficient measurements of substrates and thin films

Nicholaus Kevin Tanjaya, Ilario Bisignano, Satoshi Ishii.

Optics & Laser Technology 191 113292. 2025.

https://doi.org/10.1016/j.optlastec.2025.113292

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作成時刻: 2025-07-11 03:07:39 +0900 更新時刻: 2026-09-25 04:32:41 +0900

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