Ge(111)４結晶平行法による２層薄膜の膜厚測定
(Measurement of Thickness for Bi-layered Thin Films with Conventional Parallel Beam Diffractometer Having a Ge(111) Channel-cut F)
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2016-05-24 11:36:21 +0900 更新時刻: 2018-12-14 22:22:14 +0900