Calculations of mean escape depths of photoelectrons in elemental solids excited by linearly polarized X-rays for high-energy photoelectron spectroscopy | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Calculations of mean escape depths of photoelectrons in elemental solids excited by linearly polarized X-rays for high-energy photoelectron spectroscopy

S. Tanuma, H. Yoshikawa, H. Shinotsuka, R. Ueda.

Journal of Electron Spectroscopy and Related Phenomena 190 127-136. 2013.

https://doi.org/10.1016/j.elspec.2013.08.011

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MDRavailable Calculations of Mean Escape Depths of Photoelectrons in Elemental Solids Excited by Linearly Polarized X-rays for High-Energy Photoelectron Spectroscopy

作成時刻: 2016-05-24 17:08:31 +0900更新時刻: 2024-03-31 13:27:26 +0900

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