HOME > 論文 > 書誌詳細A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materialsSeiji Higuchi, Osamu Kubo, Hiromi Kuramochi, Masakazu Aono, Tomonobu Nakayama. Nanotechnology 22 [28] 285205. 2011.https://doi.org/10.1088/0957-4484/22/28/285205 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:22:56 +0900更新時刻: 2024-04-02 02:58:29 +0900
