Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

HOME > 論文 > 書誌詳細

Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains

Jesse R. Williams, Igor Píš, Masaaki Kobata, Aimo Winkelmann, Tomohiro Matsushita, Yutaka Adachi, Naoki Ohashi, Keisuke Kobayashi.

Journal of Applied Physics 111 [3] 033525. 2012.

https://doi.org/10.1063/1.3682088

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2016-05-24 16:37:59 +0900更新時刻: 2024-03-31 16:02:28 +0900

▲ページトップへ移動