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Moiré Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales
(Moiré Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales)

Qinghua Wang, , Hiroshi Tsuda, Satoshi Kishimoto, Yoshihisa Tanaka, Yutaka Kagawa, , .
International Journal of Automation Technology 9 [5] 494-501. 2015.
https://doi.org/10.20965/ijat.2015.p0494
Open Access Fuji Technology Press Ltd. (Publisher)

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      作成時刻: 2018-01-27 20:19:09 +0900 更新時刻: 2025-06-13 04:53:59 +0900

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