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Moiré Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales
(Moiré Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales)

Qinghua Wang, , Hiroshi Tsuda, Satoshi Kishimoto, Yoshihisa Tanaka, Yutaka Kagawa, , .

International Journal of Automation Technology 9 [5] 494-501. 2015.

https://doi.org/10.20965/ijat.2015.p0494

Open Access Fuji Technology Press Ltd. (Publisher)

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2018-01-27 20:19:09 +0900 Updated at: 2026-10-29 04:56:42 +0900

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