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Moiré Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales
(Moiré Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales)

著者Qinghua Wang, , Hiroshi Tsuda, Satoshi Kishimoto, Yoshihisa Tanaka, Yutaka Kagawa, , .
掲載誌名International Journal of Automation Technology 9 [5] 494-501
ISSN: 18817629, 18838022
出版社Fuji Technology Press Ltd.
発表年2015
言語English
DOIhttps://doi.org/10.20965/ijat.2015.p0494
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