Moiré Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales
(Moiré Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales)
著者 | Qinghua Wang, , Hiroshi Tsuda, Satoshi Kishimoto, Yoshihisa Tanaka, Yutaka Kagawa, , . |
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掲載誌名 | International Journal of Automation Technology 9 [5] 494-501 ISSN: 18817629, 18838022 |
出版社 | Fuji Technology Press Ltd. |
発表年 | 2015 |
言語 | English |
DOI | https://doi.org/10.20965/ijat.2015.p0494 |
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