Moiré Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Moiré Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales
(Moiré Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales)

Qinghua Wang, , Hiroshi Tsuda, Satoshi Kishimoto, Yoshihisa Tanaka, Yutaka Kagawa, , .

International Journal of Automation Technology 9 [5] 494-501. 2015.

https://doi.org/10.20965/ijat.2015.p0494

Open Access Fuji Technology Press Ltd. (Publisher)

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2018-01-27 20:19:09 +0900更新時刻: 2024-03-29 22:41:52 +0900

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