Moiré Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales
(Moiré Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales)

著者	Qinghua Wang, , Hiroshi Tsuda, Satoshi Kishimoto, Yoshihisa Tanaka, Yutaka Kagawa, , .
掲載誌名	International Journal of Automation Technology 9 [5] 494-501 ISSN: 18817629, 18838022
出版社	Fuji Technology Press Ltd.
発表年	2015
言語	English
DOI	https://doi.org/10.20965/ijat.2015.p0494
この文献をMendeleyにインポート