HOME > Article > DetailQuantitative atom probe analyses of rare-earth-doped ceria by femtosecond pulsed laserF. Li, T. Ohkubo, Y.M. Chen, M. Kodzuka, K. Hono. Ultramicroscopy 111 [6] 589-594. 2011.https://doi.org/10.1016/j.ultramic.2010.12.011 NIMS author(s)OHKUBO, TadakatsuHONO, KazuhiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2018-06-08 21:18:39 +0900 Updated at: 2026-11-04 05:00:25 +0900
