HOME > Article > DetailHigh Resolution Transmission Electron Microscopy of Defects in High Tc Superconductor Ba2YCu3Oy松井良夫, MUROMACHI, Eiji, 加藤克夫, 堀内繁雄, 小野晃. Jap.J.Appl.Phys. 777. 1987.NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2022-09-05 10:28:23 +0900 Updated at: 2022-09-05 10:28:23 +0900