New Insight into the Characterization of Graphene Oxide and Reduced Graphene Oxide Monolayer Flakes on Si-Based Substrates by Optical Microscopy and Raman Spectroscopy
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2021-07-14 03:00:25 +0900Updated at: 2024-04-02 03:36:40 +0900