New Insight into the Characterization of Graphene Oxide and Reduced Graphene Oxide Monolayer Flakes on Si-Based Substrates by Optical Microscopy and Raman Spectroscopy
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻 :2021-07-14 03:00:25 +0900 更新時刻 :2021-09-28 22:40:08 +0900