HOME > 論文 > 書誌詳細Theoretical calculations of the mean escape depth of secondary electron emission from compound semiconductor materialsA. Hussain, L. H. Yang, Y. B. Zou, S. F. Mao, B. Da, H. M. Li, Z. J. Ding. Journal of Applied Physics 127 [12] 125304. 2020.https://doi.org/10.1063/1.5144721 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-06-02 03:00:18 +0900 更新時刻: 2026-10-30 04:50:39 +0900
