HOME > Article > DetailNanoscale microstructural analysis of metallic materials by atom probe field ion microscopy(アトムプローブによる金属材料のナノスケール解析)K Hono. Progress in Materials Science 47 [6] 621-729. 2002.https://doi.org/10.1016/s0079-6425(01)00007-x NIMS author(s)HONO, KazuhiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 11:54:58 +0900 Updated at: 2025-11-23 05:25:22 +0900