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Advantages of a 400kV high resolution analytical electron microscope and applications

BANDO, Yoshio, 猪股吉三, 松井良夫, 北見喜三, 及川哲夫, 鈴木清一, 本田敏和, 原田嘉晏.
The Institate of Physics Conference series Number78 575. 1985.

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