HOME > 論文 > 書誌詳細Identiffication of vacancy-oxygen complexes in oxygen-implanted silicon probed with slow positronsM. Fujinami, T. Miyagoe, T. Sawada, R. Suzuki, T. Ohdaira, T. Akahane. Journal of Applied Physics 95 [7] 3404-3410. 2004.https://doi.org/10.1063/1.1652241 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 14:38:35 +0900 更新時刻: 2026-10-29 04:34:20 +0900
