SAMURAI - NIMS Researchers Database

NIMS Award Symposium 2026

HOME > Article > Detail

Control of Y2O3-Stabilized ZrO2 Thin Film Orientation by Modified Bias Sputtering.
(新しいバイアススパッタ法によるYSZ薄膜の方位配列の制御.)

福富勝夫, 青木茂樹, K. Komori, 田中吉秋, T. Asano, 前田弘, M. Fukutomi, S. Aoki, Y. Tanaka, H. Maeda.
Thin Solid Films 239 [1] 123-126. 1994.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2016-05-24 11:34:14 +0900 Updated at: 2026-11-04 05:28:13 +0900

    ▲ Go to the top of this page