HOME > Article > DetailControl of Y2O3-Stabilized ZrO2 Thin Film Orientation by Modified Bias Sputtering.(新しいバイアススパッタ法によるYSZ薄膜の方位配列の制御.)福富勝夫, 青木茂樹, K. Komori, 田中吉秋, T. Asano, 前田弘, M. Fukutomi, S. Aoki, Y. Tanaka, H. Maeda. Thin Solid Films 239 [1] 123-126. 1994.https://doi.org/10.1016/0040-6090(94)90118-x NIMS author(s)KOMORI, KazunoriFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 11:34:14 +0900 Updated at: 2026-11-04 05:28:13 +0900