HOME > 論文 > 書誌詳細Characterization of Effective Mobility and Its Degradation Mechanism in MoS2MOSFETs(Characterization of effective mobility and its degradation mechanism in MoS2 MOSFETs)Takahiro Mori, Naruki Ninomiya, Toshitaka Kubo, Noriyuki Uchida, Eiichiro Watanabe, Daiju Tsuya, Satoshi Moriyama, Masatoshi Tanaka, Atsushi Ando. IEEE Transactions on Nanotechnology 15 [4] 651-656. 2016.https://doi.org/10.1109/tnano.2016.2570280 NIMS著者渡辺 英一郎津谷 大樹Materials Data Repository (MDR)上の本文・データセット作成時刻 :2016-10-26 15:41:44 +0900 更新時刻 :2018-12-19 10:20:58 +0900