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Characterization of Effective Mobility and Its Degradation Mechanism in MoS2MOSFETs
(Characterization of effective mobility and its degradation mechanism in MoS2 MOSFETs)

Takahiro Mori, Naruki Ninomiya, Toshitaka Kubo, Noriyuki Uchida, Eiichiro Watanabe, Daiju Tsuya, Satoshi Moriyama, Masatoshi Tanaka, Atsushi Ando.

NIMS著者


Materials Data Repository (MDR)上の本文・データセット


    作成時刻 :2016-10-26 15:41:44 +0900 更新時刻 :2018-12-19 10:20:58 +0900

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