HOME > Article > DetailCrystal growth in Se70Te30 thin films followed by SEM and in situ XRD(Se70Te30薄膜中での結晶成長の評価)Simona Martinková, Jaroslav Barták, Jiri Málek, Hiroyo Segawa. Journal of Applied Physics 120 [14] 145301. 2016.https://doi.org/10.1063/1.4964425 NIMS author(s)SEGAWA, HiroyoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-11-01 03:29:02 +0900 Updated at: 2026-10-29 04:34:34 +0900