HOME > 論文 > 書誌詳細Combination of high-resolution RBS and angle-resolved XPS: accurate depth profiling of chemical statesKIMURA Kenji, NAKAJIMA Kaoru, ZHAO Ming, NOHIRA Hiroshi, HATTORI Takeo, KOBATA Masaaki, IKENAGA Eiji, KIM Jun Jin, KOBAYASHI, Keisuke, CORNARD Thierry, VANDERVORST Wilfried. SURFACE AND INTERFACE ANALYSIS 423-426. 2008.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-10-21 23:02:01 +0900 更新時刻: 2022-10-21 23:02:01 +0900
