Direct observation of redox state modulation at carbon/amorphous tantalum oxide thin film hetero-interface probed by means of in situ hard X-ray photoemission spectroscopy
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Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2016-05-24 17:09:13 +0900 更新時刻: 2026-10-08 06:24:30 +0900
