Takashi Tsuchiya; Shogo Miyoshi; Yoshiyuki Yamashita; Hideki Yoshikawa; Kazuya Terabe; Keisuke Kobayashi; Shu Yamaguchi

doi:10.1016/j.ssi.2013.09.015

Direct observation of redox state modulation at carbon/amorphous tantalum oxide thin film hetero-interface probed by means of in situ hard X-ray photoemission spectroscopy

著者	Takashi Tsuchiya, Shogo Miyoshi, Yoshiyuki Yamashita, Hideki Yoshikawa, Kazuya Terabe, Keisuke Kobayashi, Shu Yamaguchi.
掲載誌名	Solid State Ionics 253 110-118 ISSN: 01672738 ESIでのカテゴリ: PHYSICS
出版社	Elsevier BV
発表年	2013
言語	English
DOI	https://doi.org/10.1016/j.ssi.2013.09.015
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