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Structural Obsenvation of Indium Nanocrystals deposited on Si(111)thin films by UHV-FE-TEM.
(UHV-FE-TEMによるSi(111)薄膜上に蒸着されたInナノ結晶の構造観察。)

田中美代子, 竹口雅樹, 古屋一夫.

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      Created at: 2022-11-15 00:39:22 +0900Updated at: 2022-11-15 00:39:22 +0900

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