HOME > 論文 > 書誌詳細Effects of shallow traps on the reverse current of diamond Schottky diode: An electrical transient studyYiuri Garino, Tokuyuki Teraji, Satoshi Koizumi, Yasuo Koide, Toshimichi Ito. physica status solidi (a) 207 [6] 1460-1463. 2010.https://doi.org/10.1002/pssa.200925448 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:23:41 +0900更新時刻: 2024-10-06 07:35:51 +0900
