HOME > 論文 > 書誌詳細A combination of a Drickamer anvil apparatus and monochromatic X-rays for stress and strain measurements under high pressureNorimasa Nishiyama, Yanbin Wang, Tetsuo Irifune, Takeshi Sanehira, Mark L. Rivers, Steve R. Sutton, David Cookson. Journal of Synchrotron Radiation 16 [6] 742-747. 2009.https://doi.org/10.1107/s0909049509033342 NIMS著者西山 宣正Materials Data Repository (MDR)上の本文・データセット作成時刻: 2025-10-09 16:28:58 +0900 更新時刻: 2026-10-22 04:32:15 +0900
