HOME > Article > DetailA combination of a Drickamer anvil apparatus and monochromatic X-rays for stress and strain measurements under high pressureNorimasa Nishiyama, Yanbin Wang, Tetsuo Irifune, Takeshi Sanehira, Mark L. Rivers, Steve R. Sutton, David Cookson. Journal of Synchrotron Radiation 16 [6] 742-747. 2009.https://doi.org/10.1107/s0909049509033342 NIMS author(s)NISHIYAMA, NorimasaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2025-10-09 16:28:58 +0900 Updated at: 2026-10-22 04:32:15 +0900