HOME > 論文 > 書誌詳細Direct evidence of Mg diffusion through threading mixed dislocations in GaN p–n diodes and its effect on reverse leakage currentShigeyoshi Usami, Norihito Mayama, Kazuya Toda, Atsushi Tanaka, Manato Deki, Shugo Nitta, Yoshio Honda, Hiroshi Amano. Applied Physics Letters 114 [23] 232105. 2019.https://doi.org/10.1063/1.5097767 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2021-06-10 03:00:19 +0900 更新時刻: 2026-10-30 07:50:14 +0900
