“Checkerboard Stripe” Electronic State on Cleaved Surface of NdO0.7F0.3BiS2 Probed by Scanning Tunneling Microscopy

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“Checkerboard Stripe” Electronic State on Cleaved Surface of NdO0.7F0.3BiS2 Probed by Scanning Tunneling Microscopy
(“Checkerboard Stripe” Electronic State on Cleaved Surface of NdO0.7F0.3BiS2 Probed by Scanning Tunneling Microscopy)

Tadashi Machida, Yuita Fujisawa, Masanori Nagao, Satoshi Demura, Keita Deguchi, Yoshikazu Mizuguchi, Yoshihiko Takano, Hideaki Sakata.

作成時刻: 2016-05-24 17:43:26 +0900更新時刻: 2024-03-31 12:11:03 +0900