Optical properties of silicon and germanium determined by high-precision analysis of reflection electron energy loss spectroscopy spectra | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

HOME > 論文 > 書誌詳細

Optical properties of silicon and germanium determined by high-precision analysis of reflection electron energy loss spectroscopy spectra

L. H. Yang, K. Tőkési, J. Tóth, B. Da, H. M. Li, Z. J. Ding.

Physical Review B 100 [24] 245209. 2019.

https://doi.org/10.1103/physrevb.100.245209

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2020-01-09 03:00:21 +0900 更新時刻: 2026-10-30 05:28:08 +0900

▲ページトップへ移動