Optical properties of silicon and germanium determined by high-precision analysis of reflection electron energy loss spectroscopy spectra | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Optical properties of silicon and germanium determined by high-precision analysis of reflection electron energy loss spectroscopy spectra

L. H. Yang, K. Tőkési, J. Tóth, B. Da, H. M. Li, Z. J. Ding.

Physical Review B 100 [24] 245209. 2019.

https://doi.org/10.1103/physrevb.100.245209

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作成時刻: 2020-01-09 03:00:21 +0900更新時刻: 2024-03-31 01:25:38 +0900

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