Resolution Improvement in Stage-Scanning Electron Holography: Comparison with Conventional Electron Holography
(試料走査電子線ホログラフィーの解像度:従来の電子線ホログラフィーとの比較)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2016-05-24 17:26:01 +0900 Updated at: 2026-11-09 04:42:38 +0900
