HOME > 論文 > 書誌詳細Extraction of low-frequency noise in contact resistance of organic field-effect transistorsY. Xu, T. Minari, K. Tsukagoshi, R. Gwoziecki, R. Coppard, F. Balestra, J. A. Chroboczek, G. Ghibaudo. Applied Physics Letters 97 [3] 033503. 2010.https://doi.org/10.1063/1.3467057 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:09:28 +0900更新時刻: 2024-03-31 18:18:56 +0900
