Positive field and Temperature dependencies of critical current density in vanakium3-gallium and niobium3-aluminium | SAMURAI, NIMS Researchers Directory Service

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Positive field and Temperature dependencies of critical current density in vanakium3-gallium and niobium3-aluminium
(V3GaとNb3Alにおける臨界電流密度の正の磁場依存性と温度依存性)

TAKEUCHI, Takao, 田川浩平, 伊藤喜久男, 小菅通雄, YUYAMA, Michinari, 松本文明, 和田仁.

Advances in cryogenic Engineering 1003-1010. 2000.

NIMS author(s)

YUYAMA, Michinari

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2022-11-15 00:39:26 +0900 Updated at: 2022-11-15 00:39:26 +0900

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