Nondestructive estimation of depletion layer profile in Nb-doped SrTiO3/(La,Ba)MnO3 heterojunction diode structure by hard x-ray photoemission spectroscopy | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

HOME > 論文 > 書誌詳細

Nondestructive estimation of depletion layer profile in Nb-doped SrTiO3/(La,Ba)MnO3 heterojunction diode structure by hard x-ray photoemission spectroscopy

Hidekazu Tanaka, Issei Satoh, Teruo Kanki, Eiji Ikenaga, Masaaki Kobata, Jung Jin Kim, Shigenori Ueda, Keisuke Kobayashi.

Applied Physics Letters 98 [13] 133505. 2011.

https://doi.org/10.1063/1.3571454

NIMS著者

上田茂典

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2016-05-24 16:21:48 +0900 更新時刻: 2026-09-29 07:24:36 +0900

▲ページトップへ移動