Nondestructive estimation of depletion layer profile in Nb-doped SrTiO3/(La,Ba)MnO3 heterojunction diode structure by hard x-ray photoemission spectroscopy | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Nondestructive estimation of depletion layer profile in Nb-doped SrTiO3/(La,Ba)MnO3 heterojunction diode structure by hard x-ray photoemission spectroscopy

Hidekazu Tanaka, Issei Satoh, Teruo Kanki, Eiji Ikenaga, Masaaki Kobata, Jung Jin Kim, Shigenori Ueda, Keisuke Kobayashi.

Applied Physics Letters 98 [13] 133505. 2011.

https://doi.org/10.1063/1.3571454

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作成時刻: 2016-05-24 16:21:48 +0900更新時刻: 2024-12-08 07:18:07 +0900

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