HOME > Article > DetailCompositional and Chemical State Analysis of Layered Intermetallic Compounds by Line Scanning of an Etched Crater with Scanning (走査型XPSを用いた層状金属間化合物のクレーター線分析による組成・化学状態の分析)YOSHITAKE, Michiko, 吉原一紘. Journal of Surface Analysis 478-480. 1997.NIMS author(s)YOSHITAKE, MichikoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2022-11-15 00:39:11 +0900Updated at: 2022-11-15 00:39:11 +0900