HOME > Article > DetailThe Usefulness of a 400kV High-Resolution Analytical Electron MicroscopeBANDO, Yoshio, 松井良夫, 上村揚一郎, 及川哲夫, 鈴木清二, 本田敏和, 原田嘉晏. Ultramicroscopy 117. 1985.NIMS author(s)BANDO, YoshioFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2022-09-05 10:27:33 +0900 Updated at: 2022-09-05 10:27:33 +0900
