HOME > Article > DetailDoping and characterization of boron atoms in nanocrystalline silicon particlesKeisuke Sato, Naoki Fukata, Kenji Hirakuri. Applied Physics Letters 94 [16] 161902. 2009.https://doi.org/10.1063/1.3120768 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 15:45:35 +0900 Updated at: 2026-09-29 08:43:30 +0900
