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NIMS Award Symposium 2026

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Measuring interface electrostatic potential and surface charge in a scanning electron microscope
(調査顕微鏡で表面のチャージとインタフェースの電位を測り方)

I. Sychugov, Y. Nakayama, K. Mitsuishi.

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    Fulltext and dataset(s) on Materials Data Repository (MDR)


      Created at: 2016-05-24 15:54:17 +0900 Updated at: 2026-10-30 08:53:44 +0900

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