Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering

Hiroo Tajiri; Shinji Kohara; Koji Kimura; Sekhar Halubai; Haruto Morimoto; Naohisa Happo; Jens R. Stellhorn; Yohei Onodera; Xvsheng Qiao; Daisuke Urushihara; Peidong Hu; Toru Wakihara; Toyohiko Kinoshita; Koichi Hayashi; Hiroo Tajiri; Shinji Kohara; Koji Kimura; Sekhar Halubai; Haruto Morimoto; Naohisa Happo; Jens R. Stellhorn; Yohei Onodera; Xvsheng Qiao; Daisuke Urushihara; Peidong Hu; Toru Wakihara; Toyohiko Kinoshita; Koichi Hayashi

doi:10.1107/s1600577524011366

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Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering

Hiroo Tajiri, Shinji Kohara, Koji Kimura, Sekhar Halubai, Haruto Morimoto, Naohisa Happo, Jens R. Stellhorn, Yohei Onodera, Xvsheng Qiao, Daisuke Urushihara, Peidong Hu, Toru Wakihara, Toyohiko Kinoshita, Koichi Hayashi.

Journal of Synchrotron Radiation 32 [1] 125-132. 2025.

https://doi.org/10.1107/s1600577524011366

Open Access International Union of Crystallography (IUCr) (Publisher) Materials Data Repository (MDR)

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Materials Data Repository (MDR)上の本文・データセット

MDRavailable Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering

作成時刻: 2024-12-26 03:16:49 +0900更新時刻: 2024-12-27 03:17:12 +0900